External Collaborations
- Dr. M. Jamal Deen
Current
Collaborations
Dominion Astrophysical Observatory, National Research Council,
Victoria, Canada – T. Hardy and R. Murowinski, Large array charge coupled devices and CMOS
imaging systems (1989-).
Gennum Corporation, Burlington,
Ontario, Canada – D. Salvador, Radio-frequency integrated circuits (RFICs)
for transceiver applications (2002-).
IBM Corportaion, Burlington – R. Anna and J. Peckarik, High frequency noise, parameter extraction
and modeling of MOSFETs (2006-).
Institute for Microstructural Sciences, National Research Council, Ottawa – D. Landheer, Microelectronic sensors for biological
applications (2004-).
Nanowave Technology, Etobicoke, Ontario, Canada - Justin Miller and Ali Rahal, Modeling of active and passive microwave
components (1998-).
RFMD, California - Ali Rezvani, High frequency noise, parameter extraction and modeling of MOSFETs (2004-).
Sony Corportaion,
Japan – Yukihiro Kiyota, High frequency noise, parameter extraction
and modeling of MOSFETs (2004-).
Xerox, Missisauga,
Canada – Beng Ong, Plastic microelectronics (2003-).
INAOE, Puebla, Mexico – J. De La Hidalga-W., Heating effects in semiconductor devices (1999-).
Calcutta University – N.R. Das and P.K. Basu, Modeling of photonic components
(1999-).
Universite de Montpellier II (CEM2), France – F.
Pascal, Noise studies in nanoelectronic
components (2002-).
Universitat Rovira i Virgili, Tarragona – B.
Iniguez, Plastic microelectronics and
nanoelectronics (2004-).
Previous
Collaborations
Bell Northern Research, Ottawa,
Canada - L. Tarof, Tony Vetter and Bill
Clark, Modeling and characterization of
advanced avalanche photodiodes for opto-electronic communications applications (1991-1999).
Communications Research
Center, Ottawa, Canada - O. Berolo, GaAs-based resonant tunneling diodes (RTDs) - physics, digital, analog
and optical applications (1989-92).
Conexant/Rockwell Semiconductor Systems, Newport Beach, California – Y. Cheng, M. Matloubian, M.
Schroter, Z.X. Yan, High frequency
noise, parameter extraction and modeling of MOSFETs (1997-2002).
Eindhoven University of Technology, Eindhoven, Nederland - T.G.M.
Kleinpenning, Analytical modeling of
noise in MOSFETs (1991-92).
Gennum Corporation, Burlington,
Ontario, Canada - J. Kendall, Studies in bipolar junction transistors (1995-2005).
Institute for Microstructural Sciences, National Research Council, Ottawa - H.C. Liu, RTDs and infrared detectors for electronic and infrared applications (1993-1999).
Ioffe Institute, Russia – S. Rumyantsev and M.
Levinhstein, Noise in Semiconductor
Devices (1996-2001).
Mitel, Ottawa, Ontario, Canada - J. Orchard-Webb, J. Miller, Analog MOSFETs (1995-2001).
National Semiconductor Corporation, Santa Clara, California - R. Bashir, R. Taylor, Low frequency noise in bipolar transistor
(1997 - 2000).
Nortel Networks, Ottawa, Canada
- S. McGarry, Plastic transistors (1998-2002).
Northern Telecom Electronics, Ottawa - M. Doan, R. Hadaway, J. Ilowski, A. Naem, A. Ng, Low and high frequency noise, high field
effects and parameter extraction in MOSFETs, BJTs and BiCMOS circuits (1987-1995).
Perkin Elmer, Montreal
Quebec - R. Henderson, Modeling of advanced photodetectors for fiber communications (1998-
2002).
RIM, Waterloo,
Ontario– Mark
Carragher, Dave Jaworsky, RFICs for transceiver
applications (2002-2003).
Skyworks/Conexant, Ottawa,
Ontario, Canada – M. Cloutier, RFICs for transceiver applications (2002-2003).
Skyworks, Newport Beach,
California – Y. Cheng, High frequency noise, parameter extraction
and modeling of MOSFETs (2003-2005).
Texas Instruments, Dallas,
U.S.A. - A.C. Seabaugh, Noise studies and multi-valued memory applications of InP-based RTDs (1990-92).
University of Tromso,
Tromso,
Norway - Xuyuan Chen, Noise studies in advanced bipolar
transistors (1999-2004).
Zarlink, Kanata, Ottawa, Ontario, Canada – Brendon Manning, RFICs
for transceiver applications (2002-2003).
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