Senior Member IEEE, P.Eng.

- 1280 Main Street West, ITB-A321
- Hamilton, ON L8S 4K1, Canada
- Tel: (905) 525-9140 ext. 27084
- Fax: (905) 521-2922 or (905) 523-4407
- Email: chench@mcmaster.ca

- N. Valizade Shahmirzadi, N. Nikolova, and C.-H. Chen, "Interconnect for Dense Electronically Scanned Antenna Array Using High-Speed Vertical Connector,"
, 23(20), 8596, pp. 1–23, 2023.*Sensors* - B. Yang, C.-H. Chen, and S. Graham, "Technical Note: System Uncertainty on Four- and Eight-Channel Parallel RF Transmission for Safe MRI of Deep Brain Stimulation,"
, vol. 50, issue 9, pp. 5913–5919, Jun. 2023.*Medical Physics* - N. Valizade Shahmirzadi, V. Tyagi, J. Nguyen, R. Kazemivala, N. K. Nikolova, and C.-H. Chen, "Planar Array of UWB Active Slot Antennas for Microwave Imaging of the Breast,"
vol. 71, issue 4, pp. 2946–2957, Jan. 2023.*IEEE Trans. Antennas Propagat.,* - B. Yang, C.-H. Chen, and S. Graham, "RF Heating Dependence of Head Model Positioning using 4-channel Parallel Transmission MRI and a Deep Brain Stimulation Construct,"
vol. 4, issue 3, pp. 83–87, Jun. 2022.*IEEE Lett. Electromagn. Compat. Practice Applicat.,* - Invited Paper, C.-H. Chen, "Thermal Noise Measurement and Characterization for Modern Semiconductor Devices,"
vol. 24, issue 2, pp. 60–71, Apr. 2021.*Special Issue of IEEE Instrument & Measurement Magazine,* -
B. Yang, F. Tam, B. Davidson, P.-S. Wei, C. Hamani, N. Lipsman, C.-H. Chen, and S.
Graham, “Technical Note: An Anthropomorphic Phantom with Implanted Neurostimulator for
Investigation of MRI Safety,”
, vol. 47, issue 8, pp. 3745 – 3751, August 2020.*Medical Physics* - O. Marinov, M. J. Deen, J. A. Jiménez-Tejada, and C.-H. Chen, “Variable-Range Hopping
Charge Transport in Organic Thin-Film Transistors,”
, vol. 844, pp. 1-105, Feb. 2020.*Physics Reports* - S. Majumder, L. Chen, O. Marinov, C.-H. Chen, T. Mondal, and M. J. Deen, “Noncontact
Wearable Wireless ECG System for Long-Term Monitoring,”
, vol. 11, pp. 306-321, May 2018.*IEEE Reviews in Biomedical Engineering* - X. Chen, C.-H. Chen, and R. Lee, "Fast Evaluation of Channel Noise in Nano-Scale MOSFETs
for Mixed-Signal Applications,"
, vol. 65, issue 4, pp. 1502-509, April 2018.*IEEE Trans. Electron Devices* - P. Mandal, K. Tank, T. Mondal, C.-H. Chen, and M. J. Deen, "Predictive Walking-Age
Health Analyzer,"
, vol. 22, issue 2, pp. 363-374, March 2018.*IEEE Journal of Biomedical and Health Informatics* -
Y. Qin, A. U. Alam, S. Pan, M. R. Howlader, R. Ghosh, N.-X. Hu, H. Jin, S. Dong, C.-H.
Chen, and M. J. Deen, "Integrated
Water Quality Monitoring System with pH, Free Chlorine, and Temperature Sensors,"
*Sensors and Actuators B: Chemical* -
P. Lopez-Varo, J. A. Jimenez-Tejada, O. Marinov, J. E. Carceller, C.-H. Chen, and M. J.
Deen, "Boundary Condition Model for
the Simulation of Organic Solar Cells,"
*Organic Electronics* - X. Chen, C.-H. Chen, R. Lee, D. C. Chen, and D. Y. Wu, "Direct De-embedding of Noise
Factors
for On-Wafer Noise Measurement,"
*IEEE Trans. Microwave Theory and Techniques* - P. Lopez-Varoa, J. A. Jimenez Tejada, O. Marinovb, C.-H. Chen, and M. J. Deen, "Charge
Density
at the Contacts of Symmetric and Asymmetric Organic Diodes,"
*Organic Electronics* - E.-Y. Jeong, M. J. Deen, C.-H. Chen, R.-H. Baek, J.-S. Lee, and Y.-H. Jeong, "Physical
DC and
Thermal Noise Models of 18 nm Double-Gate Junctionless P-Type MOSFETs for Low Noise RF
Applications,"
*Japanese Journal of Applied Physics* - X. Chen, M. K. Tsai, C.-H. Chen, R. Lee, and D. C. Chen, "Extraction of Gate Resistance
in Sub-100nm
MOSFETs with Statistical Verification,"
*IEEE Trans. Electron Devices* - C.-H. Chen, P. Lei, and C. W. Liang, "Impact of Impedance-Dependent Receiver Gain on the
Extracted
Channel Thermal Noise in Sub-100nm MOSFETs,"
*Mathematical and Computer Modeling* - C.-H. Chen, R. Lee, G. Tan, D. C. Chen, P. Lei, and C. S. Yeh, "Equivalent Sheet
Resistance of
Intrinsic Noise in Sub-100nm MOSFETs,"
*IEEE Trans. Electron Devices* - M. Yan, C.-H. Chen, Q. Y. Xu, and W. P. Huang, "A Dual Continuous- and Bust-Mode Clock
Recovery
Module Utilizing Fiber Dispersion,"
*Microwave and Optical Technology Letters* - M. Yan, Q. Y. Xu, C.-H. Chen, W. P. Huang, and X. Hong, "Schemes of Optical Power
Splitter Nodes
for Direct ONU-ONU Intercommunication,"
*Microwave and Optical Technology Letters* - M. Yan, C.-H. Chen, Q. Xu, and W. P. Huang, "Experimental Demonstration of a Clock
Recovery Scheme
Utilizing Nonlinear Relaxation Oscillation in Directly Modulated Lasers,"
*Microwave and Optical Technology Letters* -
Invited Paper, C.-H. Chen, "Accuracy Issues of
On-Wafer Noise Measurements,"
*Fluctuation and Noise Letters* - M. Yan, C.-H. Chen, and W. P. Huang, "A Clock Recovery Scheme Utilizing Fiber Dispersion
for
Burst Mode Transmission,"
*Journal of Optical Communications* -
Invited Paper, C.-H. Chen, Y. L. Wang, and M.
Bakr, "Wave-Based Approach for Microwave
Noise Characterization,"
*Fluctuation and Noise Letters* - C.-H. Chen, Y. L. Wang, M. Bakr, and Z. Zeng, "Novel Noise Parameter Determination for
On-Wafer
Microwave Noise Measurements,"
*IEEE Trans. Instrumentation & Measurement* - M. Yan, C.-H. Chen, and W. P. Huang, "Burst-Mode Clock Recovery Utilizing Relaxation
Oscillation
in Directly Modulated Lasers,"
*IEEE/OSA Journal of Lightwave Technology* - S. Asgaran, M. J. Deen, C.-H. Chen, G. A. Rezvani, Y. Kamali, and Y. Kiyota, "Analytical
Extraction
of MOSFET's High Frequency Noise Parameters from NF50 Measurements and its Application
in
RFIC Design,"
*IEEE Journal of Solid-State Circuits* - S. Asgaran, M. J. Deen, and C.-H. Chen, "Design of the Input Matching Network of RF CMOS
LNAs
for Low-Power Operation,"
*IEEE Trans. Circuit and Systems I* -
Invited Review Paper, J. C. Ranuarez, M. J.
Deen, and C.-H. Chen, "A Review of Gate
Tunneling Current in MOS Devices,"
*Microelectronics Reliability* -
Invited Paper, M. J. Deen, C.-H. Chen, S.
Asgaran, G. A. Rezvani, J. Tao, and Y. Kiyota,
"High Frequency Noise of Modern MOSFETs: Compact Modeling and Measurement Issues,"
*IEEE Trans. Electron Devices* - J. C. Ranuarez, M. J. Deen, and C.-H. Chen, "Temperature Effects in Complementary
Metal-Oxide
Semiconductor Microwave Distributed Amplifiers,"
*Journal of Vacuum Science and Technology A* - S. Asgaran, M. J. Deen, and C.-H. Chen, "A 4 mW Monolithic CMOS LNA at 5.7 GHz with the
Gate
Resistance Used for Input Matching,"
*IEEE Microwave and Wireless Components Letters* -
Invited Paper, S. Naseh, M. J. Deen, and C.-H.
Chen, "Hot-Carrier Reliability of Submicron
NMOSFETs and Integrated NMOS Low Noise Amplifiers,"
*Microelectronics Reliability*, - S. Naseh, M. J. Deen, and C.-H. Chen, "Effects of Hot-Carrier Stress on the Performance
of CMOS
Low Noise Amplifiers,"
*IEEE Trans. Device and Materials Reliability* - J. C. Ranuarez, M. J. Deen, and C.-H. Chen, "Modeling the Partition of Noise from the
Gate Tunneling
Current in MOSFETs,"
*IEEE Electron Device Letters*, -
Invited Paper, Y. Cheng, M. J. Deen, and C.-H.
Chen, "MOSFET Modeling for RFIC Design,"
*IEEE Trans. Electron Devices* - S. Asgaran, M. J. Deen, and C.-H. Chen, "Analytical Modeling of MOSFET's Channel Noise
and Noise
Parameters,"
*IEEE Trans. Electron Devices* - C.-H. Chen and M. J. Deen, "Channel Noise Modeling of Deep Sub-Micron MOSFETs,"
*IEEE Trans. Electron Device* - Y. Cheng, C.-H. Chen, M. Matloubian, and M. J. Deen, "High Frequency Small Signal AC and
Noise
Modeling of MOSFETs for RF IC Design,"
*IEEE Trans. Electron Devices* - C.-H. Chen, M. J. Deen, Y. Cheng, and M. Matloubian, "Extraction of the Induced Gate
Noise, Channel
Thermal Noise and their Correlation in Sub-Micron MOSFETs from RF Noise Measurements,"
*IEEE Trans. Electron Devices* - C.-H. Chen and M. J. Deen, "A General Noise and S-Parameter De-Embedding Procedure for
On-Wafer
High-Frequency Noise Measurements of MOSFETs,"
*IEEE Trans. Microwave Theory and Techniques* -
Invited Paper, C.-H. Chen and M. J. Deen, "RF
CMOS Noise Characterization and Modeling,"
*International Journal of High Speed Electronics and Systems* - C.-H. Chen and M. J. Deen, "Direct Extraction of the Channel Thermal Noise in
Metal-Oxide-Semiconductor
Field Effect Transistor from Measurements of Their RF Noise Parameters,"
**Journal of Vacuum Science and Technology A** - W. S. Kwan, C.-H. Chen, and M. J. Deen, "Hot-Carrier Effects on RF Noise Characteristics
of LDD
NMOSFET,"
**Journal of Vacuum Science and Technology A** - E. Abou-Allam, T. Manku, C.-H. Chen, and M. J. Deen, "A Self-Consistent Lumped Radio
Frequency
Linear Network Model for MOSFETs Taking into Account the Gate Resistance,"
*Canadian Journal of Physics* - C.-H. Chen and M. J. Deen, "High Frequency Noise of MOSFETs I - Modeling,"
*Solid-State Electronics* - C.-H. Chen, M. J. Deen, Z. X. Yan, M. Schroter, and C. Enz, "High Frequency Noise of
MOSFETs
II - Experiments,"
*Solid-State Electronics* - C.-H. Chen and M. J. Deen, "Direct Calculation of MOSFET High Frequency Noise
Parameters,"
**Journal of Vacuum Science and Technology A** - N. V. Shahmirzadi, N. K. Nikolova, and C.-H. Chen, "Transmitting Arrays for an Electronically Switched Microwave Breast Scanner," submitted to
Florence, Italy, p. 1 (14–19 Jul. 2024).*2024 IEEE International Symposium on Antennas and Propagation and ITNC-USNC-URSI Radio Science Meeting,* - N. Valizade Shahmirzadi, J. Nguyen, R. Kazemivala, N. K. Nikolova, and C.-H. Chen, "Electronically Scanned Active Sensor Array for the Imaging of Compressed Breast,"
Florence, Italy, pp. 1–4 (26–31 Mar. 2023).*17th European Conference on Antennas and Propagation,* - X. Chen, H. Elgabra, C.-H. Chen, J. Baugh, and L. Wei, "Estimation of MOSFET Channel Noise and Noise Performance of CMOS LNAs at Cryogenic Temperatures,"
Daegu, Korea, pp. 1–5, (23–25 May 2021).*2021 IEEE International Symposium on Circuits and Systems (ISCAS 2021),* - V. Tyagi, N. K. Nikolova, F. Foroutan, C.-H. Chen, and C. Baard, "UWB Planar Bias-switched Imaging Array for Breast-Cancer Screening,"
, Dusseldorf, Germany, pp. 1–5 (22–26 Mar. 2021).*15th European Conference on Antennas and Propagation (EuCAP 2021)* -
B. Yang, C.-H. Chen, and S. J. Graham, “Signal-to-Noise Measurement of a 4-Channel
Parallel Radiofrequency Transmission System for MRI at 3 T,”
p. 4035 (11 – 14 August 2020).*Proc. Intl. Soc. Magn. Reson. Med.,* -
B. Yang, F. Tam, B. Davidson, C. Hamani, N. Lipsman, C.-H. Chen, and S. J. Graham, “MRI
Safety of Deep Brain Stimulation Devices: Radiofrequency Heating of a Commercial Lead
and an Insulated Copper Wire,”
p. 4182 (11 – 14 August 2020).*Proc. Intl. Soc. Magn. Reson. Med.,* - A. U. Alam, S. Majumder, C.-H. Chen, O. Marinov, and M. J. Deen, “Low Frequency Noise in
Electrochemical Sensors for Water Quality Monitoring,”
, pp. 1-6, Neuchâtel, Switzerland 2019.*25th International Conference on Noise and Fluctuations (ICNF 2019)* - Invited Paper, C.-H. Chen, X. Chen, and P. Do,
"Recent Advancement in High-Frequency
Noise Characterization for Nano-Scale FETs,"
, pp. 1-4, Qingdao, China (October. 31 - November. 3, 2018).*14 th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT 2018)* - C.-H. Chen, B. Yang, P.-H. Chu, G. Brown, and S. Das, "System Aware DUT Design for
Optimum On-Wafer Noise Measurement," 31 st IEEE
, Austin, TX, pp. 206-209 (19-22 March, 2018).*International Conference on Microelectronic Test Structures (ICMTS '18)* -
X. Chen, C.-H. Chen, and M. J. Deen, "Shot Noise Suppression Factor for Nano-Scale
MOSFETs Working in the Saturation Region,"
*24*^{th}*International Conference on Noise and Fluctuations***(ICNF 2017)**, pp. 1-4, Vilnius, Lithuania (20-23 June, 2017). -
Invited Paper, C.-H. Chen, X. Chen, D. Y. Wu and
C. S. Chen, "Future Low-Noise Technologies
for RF, Analog and Mixed-Signal Integrated Circuits,"
*The IEEE 11*^{th}*International Conference on ASIC***(**, Chengdu, China, pp. 1-4 (3-6 November, 2015).*ASICON 2015*) -
Invited Paper, C.-H. Chen, D. Y. Wu, and M. K.
Tsai, "The Impact of Material Property
on the Noise Performance of Future Nanoscale Field-Effect-Transistors, "
*Collaborative Conference on 3D and Materials Research (CC3DMR) 2015* - X. Chen, N. Misljenovic, B. Hosein, C.-H. Chen, and C. Tsironis, "Calibration of a Noise
Receiver
Taking Care of its Gain Variations,"
*23*^{rd}*International Conference on Noise and Fluctuations***(**, Xi'an China, pp. 1-4 (2-6 June, 2015).*ICNF 2015*) -
Invited Paper, C.-H. Chen, D. Y. Wu, Y. C.
Cheng, and C. S. Chen, "Future CMOS Technology
for Low Noise Integrated Circuit Designs,"
*Proc. 2014 12*^{th}*International Conference on Solid-State and Integrated-Circuit Technology* - E. Y. Jeong, M. J. Deen, C.-H. Chen, R.-H. Beak, J.-S. Lee, and Y. H. Jeong, "Physical
DC and
Thermal Noise Models of 18 nm Double-Gate Junctionless pMOSFETs for Low Noise RF
Applications,"
*46*^{th}*International Conference on Solid State Devices and Materials***(**, Tsukuba, Ibaraki, Japan, pp. PS-3-12 (8-11 September, 2014).*SSDM 2014*) -
Invited Paper, C.-H. Chen, D. Chen, R. Lee, P.
Lei, and D. Wan, "Thermal Noise Modeling
of Nano-Scale MOSFETs for Mixed-signal and RF Applications,"
*IEEE Custom Integrated Circuits Conference*(*CICC 2013*) - E. Y. Jeong, Y. H. Jeong, C.-H. Chen, and M. J. Deen, "DC and Thermal Noise Modeling of
20 nm
Double-Gate Junctionless MOSFETs,"
*22*^{nd}*International Conference on Noise and Fluctuations***(**, Montpellier, France, pp. 1-4 (24-28 June, 2013).*ICNF 2013*) -
Invited Paper, C.-H. Chen, "Future Integrated
Circuit Technology for Low Noise Applications,"
*BIT's 2*^{nd }*Annual World Congress of Advanced Materials (WCAM-2013)* - G. Tan, C.-H. Chen, B. Hung, P. Lei, and C. S. Yeh, "Channel Thermal Noise and its
Scaling Impact
on Deep Sub-100nm MOSFETs,"
*21*^{st}*International Conference on Noise and Fluctuations***(**, Toronto, Canada, pp. 360-363 (12-16 June, 2011).*ICNF 2011*) -
Invited Paper, C.-H. Chen, B. Hung, S. Huang, J.
S. Jan, V. Liang, and C. S. Yeh,
"Thermal Noise Performance in Recent CMOS Technologies,"
*The 9*^{th}*International Conference on Solid-State and Integrated-Circuit Technology* -
Invited Paper, C.-H. Chen, A. Leung, and H. Gon,
"Design and Modeling of RF ICs for
Low-Noise and Low-Power Transceivers,"
*International Conference on Electron Devices and Solid-State Circuits* - Y. Kiyota, C.-H. Chen, T. Kubodera, A. Nakamura, K. Takeshita, and M. J. Deen, "A New
Approach
of High Frequency Noise Modeling for 70-nm NMOS by Accurate Noise Source Extraction,"
*2007 IEEE Radio Frequency Integrated Circuits*(*RFIC*)*Symposium* -
Invited Paper, C.-H. Chen, Z. Zeng, J. S. Jan,
and C. S. Yeh, "Challenges in HF noise
characterization and modeling of Sub-100nm MOSFETs for RF ICs,"
*International Conference on Fluctuations and Noise - Circuits, Devices and Materials* - S. Asgaran, M. J. Deen, and C.-H. Chen, "An Analytical Method to Determine MOSFET's High
Frequency
Noise Parameters from 50 Ohm Noise Figure Measurements, "
*IEEE Radio Frequency Integrated Circuits (RFIC) Symposium* -
Invited Paper, C.-H. Chen, "High-frequency Noise
of MOSFETs - Characterization and
Modeling,"
*13*^{th}*International Workshop on the Physics of Semiconductor Devices***(IWPSD-2005)**, New Delhi, India, pp. 787-795 (13-17 December, 2005). -
Invited Paper, C.-H. Chen, "Issues in
High-Frequency Noise Characterization and Modeling
of MOSFETs,"
*1*^{st}*IEEE International Workshop on Radio-Frequency Integration Technology***(RFIT 2005)**, Singapore, pp. 119-122 (November 30 - December 2, 2005). -
Invited Paper, M. J. Deen, J. C. Ranuarez, and
C.-H. Chen, "Effect of the Gate Tunneling
Current on the High-Frequency Noise of MOSFETs,"
*Workshop on Compact Modeling* - S. Asgaran, M. J. Deen, and C.-H. Chen, "Analytical Modeling of MOSFET Noise Parameters
for Analog
and RF Applications,"
*IEEE Custom Integrated Circuits Conference*(*CICC 2004*) -
Invited Paper, C.-H. Chen, S. Asgaran, F. Li,
and M. J. Deen, "Characterization and
Modeling of High-Frequency Noise in MOSFETs for RF IC Design,"
*2*^{nd}*International Conference on Fluctuations and Noise - Devices and Circuits* - C.-H. Chen, F. Li, and Y. Cheng, "MOSFET Drain and Induced-gate Noise Modeling and
Experimental
Verification for RF IC Design,"
*IEEEInternational Conference on Microelectronics Test Structures***(**, Awaji, Japan, pp. 51-56 (22-25 March, 2004).*ICMTS 2004*) -
Invited Paper, M. J. Deen, C.-H. Chen, and Y.
Cheng, "MOSFET Modeling for Low Noise,
RF Circuit Design,"
*IEEE Custom Integrated Circuits Conference*(*CICC 2002*) -
Invited Paper, M. J. Deen, and C.-H. Chen, "RF
MOSFET Noise Parameter Extraction and
Modeling,"
*5*^{th}*International Conference on Modeling and Simulation of Microsystems***(**, San Juan, Puerto Rico, pp. 694 - 697 (22-25 April, 2002).*MSM 2002*) - C.-H. Chen, M. Jamal Deen, Y. Cheng, and M. Matloubian, "High-Frequency Noise of
MOSFETs,"
*16th International Conference on Noise in Physical Systems and 1/f Fluctuations*(*ICNF 2001*) - C.-H. Chen, M. J. Deen, Y. Cheng, and M. Matloubian, "Intrinsic Noise Currents in Deep
Submicron
MOSFETs,"
*IEEE MTT-S International Microwave Symposium*(*IMS 2001*) - C.-H. Chen and M. J. Deen, "A General Procedure for High-Frequency Noise Parameter
De-embedding
of MOSFETs by Taking the Capacitive Effects of Metal Interconnections into Account,"
*IEEE International Conference on Microelectronic Test Structures*(*ICMTS 2001*) - C.-H. Chen, M. J. Deen, M. Matloubian, and Y. Cheng, "Extraction of the Induced Gate
Noise, Channel
Thermal Noise and their Correlation in Sub-Micron MOSFETs from RF Noise Measurements,"
*IEEE International Conference on Microelectronic Test Structures*(*ICMTS 2001*) -
Invited Paper, M. J. Deen, C.-H. Chen, Y. Cheng,
C. Enz, and M. Matloubian, "
*RF Modeling of MOSFETs*,"*Design, Modeling and Simulation in Microelectronics*(*International Symposium on Microelectronics and Assembly - ISMA 2000*) - C.-H. Chen, M. J. Deen, M. Matloubian, and Y. Cheng, "Channel Noise Current in Deep
Sub-Micron
MOSFETs,"
*30*^{th}*European Solid-State Device Research Conference***(**, Cork, Ireland, pp. 508 - 511 (11-13 September, 2000).*ESSDERC' 2000*) - C.-H. Chen, M. J. Deen, M. Matloubian, and Y. Cheng, "Extraction of the Channel Thermal
Noise
in MOSFETs,"
*IEEE International Conference on Microelectronic Test Structures*(*ICMTS 2000*) -
Invited Paper, Y. Cheng, C.-H. Chen, C. Enz, M.
Matloubian, and M. J. Deen, "MOSFET
Modeling for RF Circuit Design,"
*3*^{rd}*IEEE International Caracas Conference on Devices, Circuits and Systems***(**, Cancun, Mexico, pp. D23, 1 - 8 (15-17 March, 2000).*ICCDCS 2000*) - M. J. Deen, C.-H. Chen, M. Matloubian, and Y. Cheng, "Channel Thermal Noise Extraction
and Model
Verification of MOSFETs,"
*1999 International Semiconductor Device Research Symposium***(**, Charlottesville, Virginia, pp. 85 - 88 (1-3 December, 1999).*ISDRS '99*) - C.-H. Chen and M. J. Deen, "Direct Extraction of the Channel Thermal Noise in MOSFETs
from RF
Noise Measurements,"
**9**^{th}*Canadian Semiconductor Technology Conference***(**, Ottawa, Canada, p.163*CSTC '99*) - W. S. Kwan, C.-H. Chen and M. J. Deen, "Hot-Carrier Effects on RF Noise Characteristics
of LDD
NMOSFET,"
**9**^{th}*Canadian Semiconductor Technology Conference***(**, Ottawa, Canada, p. 79 (10-13 August, 1999).*CSTC '99*) -
Invited Paper, M. J. Deen and C.-H. Chen, "Some
Issues in High Frequency Noise Modeling
of MOSFETs,"
*2*^{nd}*International Conference on Unsolved Problems of Noise and Fluctuations***(**, Adelaide, Australia, pp. 381-392 (11-15 July, 1999).*UPON '99*) - M. J. Deen and C.-H. Chen, "The Impact of Noise Parameter De-embedding on the High
Frequency
Noise Modeling of MOSFETs,"
*IEEE International Conference on Microelectronic Test Structures***(**, Goteborg, Sweden, pp. 34 - 39 (15-18 March, 1999).*ICMTS '99*) - X. Jin, J-J. Ou, C.-H. Chen, W. Liu, M. J. Deen, P. R. Gray, and C. Hu, "An Effective
Gate Resistance
Model for CMOS RF and Noise Modeling,"
*International Electron Devices Meeting Technical Digest***(**, San Francisco, California, pp. 961 - 964 (6-9 December, 1998).*IEDM '98*) - W. S. Kwan, C.-H. Chen, and M. J. Deen, "Hot-Carrier Effects on the High Frequency
Performance
of 0.8mm LDD NMOSFETs,"
*1997 International Semiconductor Device Research Symposium***(**, Charlottesville, Virginia, pp. 195 - 198 (11-13 December, 1997).*ISDRS '97*) - C.-H. Chen and M. J. Deen, "Direct Calculation of the MOSFET High Frequency Noise
Parameters,"
*14*^{th}*International Conference on Noise in Physical Systems and 1/f Fluctuations* - C.-H. Chen and M. J. Deen, "Direct Calculation of the MOSFET High Frequency Noise
Parameters,"
**8**^{th}*Canadian Semiconductor Technology Conference***(**, Ottawa, Canada, p. 147 (12-15 August, 1997).*CSTC'97*) -
Invited Book Chapter, C.-H. Chen,
*Thermal Noise in Modern CMOS Technology*,*Solid State Circuits Technologies* -
Invited Book Chapter, C.-H. Chen and M. J. Deen,
*RF CMOS Noise Characterization and Modeling*, in*Selected Topics in Electronics and Systems - Vol. 24: CMOS RF Modeling, Characterization and Applications* - C.-H. Chen, S. Naseh, and M. J. Deen, "Design Strategies of a Low Noise Amplifier and
Some Reliability
Considerations,"
*2002 Micronet R & D Annual Workshop* - C.-H. Chen and M. J. Deen, "A General Procedure for High-Frequency Noise Parameter
De-embedding
of MOSFETs by Taking the Capacitive Effects of Metal Interconnections into Account,"
*2001 Micronet R & D Annual Workshop* - C.-H. Chen and M. J. Deen, "Extraction of the Induced Gate Noise, Channel Noise and
their Correlation
in Sub-Micron MOSFETs from RF Noise Measurements, "
**2001 Micronet R & D Annual Workshop** - C.-H. Chen and M. J. Deen, "Channel Thermal Noise Extraction and Model Verification of
MOSFETs,"
**Micronet 10th Anniversary Workshop** - C.-H. Chen, W. S. Kwan, and M. J. Deen, "Experimental Results on High Frequency Noise
Parameter
De-Embedding of MOSFETs,"
**1999 Micronet Annual Workshop** - C.-H. Chen, W. S. Kwan, and M. J. Deen, "Theory of High Frequency Noise Parameter
De-Embedding
of MOSFETs,"
**1999 Micronet Annual Workshop** - C.-H. Chen, M. J. Deen, Z. X. Yan, and M. Schroter, "High Frequency Noise of MOSFETs -
Experiments
and Modeling,"
**1998 Micronet Annual Workshop** - C.-H. Chen, W. S. Kwan, L. Nathawad, and M. J. Deen, "Direct Calculation of the MOSFET
High Frequency
Noise Parameters,"
**1997 Micronet Annual Workshop** - C.-H. Chen and M. J. Deen, "Analytical Modelling of the High Frequency Noise in
MOSFETs,"
**1996 Micronet Annual Workshop**