Chih-Hung (James) Chen

Associate Professor
Senior Member IEEE, P.Eng.
  • 1280 Main Street West, ITB-A321
  • Hamilton, ON L8S 4K1, Canada
  • Tel: (905) 525-9140 ext. 27084
  • Fax: (905) 521-2922 or (905) 523-4407
  • Email: chench@mcmaster.ca

    Chih-Hung Chen on Google Scholar

    Refereed Journals 48

  • N. Valizade Shahmirzadi, N. Nikolova, and C.-H. Chen, "Interconnect for Dense Electronically Scanned Antenna Array Using High-Speed Vertical Connector," Sensors, 23(20), 8596, pp. 1–23, 2023.
  • B. Yang, C.-H. Chen, and S. Graham, "Technical Note: System Uncertainty on Four- and Eight-Channel Parallel RF Transmission for Safe MRI of Deep Brain Stimulation," Medical Physics, vol. 50, issue 9, pp. 5913–5919, Jun. 2023.
  • N. Valizade Shahmirzadi, V. Tyagi, J. Nguyen, R. Kazemivala, N. K. Nikolova, and C.-H. Chen, "Planar Array of UWB Active Slot Antennas for Microwave Imaging of the Breast," IEEE Trans. Antennas Propagat., vol. 71, issue 4, pp. 2946–2957, Jan. 2023.
  • B. Yang, C.-H. Chen, and S. Graham, "RF Heating Dependence of Head Model Positioning using 4-channel Parallel Transmission MRI and a Deep Brain Stimulation Construct," IEEE Lett. Electromagn. Compat. Practice Applicat., vol. 4, issue 3, pp. 83–87, Jun. 2022.
  • Invited Paper, C.-H. Chen, "Thermal Noise Measurement and Characterization for Modern Semiconductor Devices," Special Issue of IEEE Instrument & Measurement Magazine, vol. 24, issue 2, pp. 60–71, Apr. 2021.
  • B. Yang, F. Tam, B. Davidson, P.-S. Wei, C. Hamani, N. Lipsman, C.-H. Chen, and S. Graham, “Technical Note: An Anthropomorphic Phantom with Implanted Neurostimulator for Investigation of MRI Safety,” Medical Physics, vol. 47, issue 8, pp. 3745 – 3751, August 2020.
  • O. Marinov, M. J. Deen, J. A. Jiménez-Tejada, and C.-H. Chen, “Variable-Range Hopping Charge Transport in Organic Thin-Film Transistors,” Physics Reports, vol. 844, pp. 1-105, Feb. 2020.
  • S. Majumder, L. Chen, O. Marinov, C.-H. Chen, T. Mondal, and M. J. Deen, “Noncontact Wearable Wireless ECG System for Long-Term Monitoring,” IEEE Reviews in Biomedical Engineering, vol. 11, pp. 306-321, May 2018.
  • X. Chen, C.-H. Chen, and R. Lee, "Fast Evaluation of Channel Noise in Nano-Scale MOSFETs for Mixed-Signal Applications," IEEE Trans. Electron Devices, vol. 65, issue 4, pp. 1502-509, April 2018.
  • P. Mandal, K. Tank, T. Mondal, C.-H. Chen, and M. J. Deen, "Predictive Walking-Age Health Analyzer," IEEE Journal of Biomedical and Health Informatics, vol. 22, issue 2, pp. 363-374, March 2018.
  • Y. Qin, A. U. Alam, S. Pan, M. R. Howlader, R. Ghosh, N.-X. Hu, H. Jin, S. Dong, C.-H. Chen, and M. J. Deen, "Integrated Water Quality Monitoring System with pH, Free Chlorine, and Temperature Sensors," Sensors and Actuators B: Chemical , vol. 255, part 1, pp. 781-790, February 2018.
  • P. Lopez-Varo, J. A. Jimenez-Tejada, O. Marinov, J. E. Carceller, C.-H. Chen, and M. J. Deen, "Boundary Condition Model for the Simulation of Organic Solar Cells," Organic Electronics , vol. 48, pp. 85-95, September 2017.
  • X. Chen, C.-H. Chen, R. Lee, D. C. Chen, and D. Y. Wu, "Direct De-embedding of Noise Factors for On-Wafer Noise Measurement," IEEE Trans. Microwave Theory and Techniques , pp. 916-929, November, 2016.
  • P. Lopez-Varoa, J. A. Jimenez Tejada, O. Marinovb, C.-H. Chen, and M. J. Deen, "Charge Density at the Contacts of Symmetric and Asymmetric Organic Diodes," Organic Electronics , vol. 35, pp. 74-86, August 2016.
  • E.-Y. Jeong, M. J. Deen, C.-H. Chen, R.-H. Baek, J.-S. Lee, and Y.-H. Jeong, "Physical DC and Thermal Noise Models of 18 nm Double-Gate Junctionless P-Type MOSFETs for Low Noise RF Applications," Japanese Journal of Applied Physics , vol. 54, pp. 04DC08-1~6, 2015.
  • X. Chen, M. K. Tsai, C.-H. Chen, R. Lee, and D. C. Chen, "Extraction of Gate Resistance in Sub-100nm MOSFETs with Statistical Verification," IEEE Trans. Electron Devices , vol. 61, no. 9, pp. 3111-3117, September 2014.
  • C.-H. Chen, P. Lei, and C. W. Liang, "Impact of Impedance-Dependent Receiver Gain on the Extracted Channel Thermal Noise in Sub-100nm MOSFETs," Mathematical and Computer Modeling , vol. 58, issue 1-2, pp. 355-362, July 2013.
  • C.-H. Chen, R. Lee, G. Tan, D. C. Chen, P. Lei, and C. S. Yeh, "Equivalent Sheet Resistance of Intrinsic Noise in Sub-100nm MOSFETs," IEEE Trans. Electron Devices , vol. 59, no. 8, pp. 2215-2220, August 2012.
  • M. Yan, C.-H. Chen, Q. Y. Xu, and W. P. Huang, "A Dual Continuous- and Bust-Mode Clock Recovery Module Utilizing Fiber Dispersion," Microwave and Optical Technology Letters , vol. 52, issue 8, pp. 1747-1750, August 2010.
  • M. Yan, Q. Y. Xu, C.-H. Chen, W. P. Huang, and X. Hong, "Schemes of Optical Power Splitter Nodes for Direct ONU-ONU Intercommunication," Microwave and Optical Technology Letters , vol. 51, issue 12, pp. 2814-2817, December 2009.
  • M. Yan, C.-H. Chen, Q. Xu, and W. P. Huang, "Experimental Demonstration of a Clock Recovery Scheme Utilizing Nonlinear Relaxation Oscillation in Directly Modulated Lasers," Microwave and Optical Technology Letters , vol. 51, no. 7, pp. 1654-1657, July 2009.
  • Invited Paper, C.-H. Chen, "Accuracy Issues of On-Wafer Noise Measurements," Fluctuation and Noise Letters , vol. 8, issues 3-4, pp. L281-L303, December 2008.
  • M. Yan, C.-H. Chen, and W. P. Huang, "A Clock Recovery Scheme Utilizing Fiber Dispersion for Burst Mode Transmission," Journal of Optical Communications , vol. 29, issue 3, pp. 134-140, 2008.
  • Invited Paper, C.-H. Chen, Y. L. Wang, and M. Bakr, "Wave-Based Approach for Microwave Noise Characterization," Fluctuation and Noise Letters , vol. 8, issue 1, pp. R1-R14, March 2008.
  • C.-H. Chen, Y. L. Wang, M. Bakr, and Z. Zeng, "Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements," IEEE Trans. Instrumentation & Measurement , vol. 57, issue 11, pp. 2462-2471, November 2008.
  • M. Yan, C.-H. Chen, and W. P. Huang, "Burst-Mode Clock Recovery Utilizing Relaxation Oscillation in Directly Modulated Lasers," IEEE/OSA Journal of Lightwave Technology , vol. 26, no. 12, pp. 1569-1576, June 15 2008.
  • S. Asgaran, M. J. Deen, C.-H. Chen, G. A. Rezvani, Y. Kamali, and Y. Kiyota, "Analytical Extraction of MOSFET's High Frequency Noise Parameters from NF50 Measurements and its Application in RFIC Design," IEEE Journal of Solid-State Circuits , vol. 42, no. 5, pp. 1034-1043, May 2007.
  • S. Asgaran, M. J. Deen, and C.-H. Chen, "Design of the Input Matching Network of RF CMOS LNAs for Low-Power Operation," IEEE Trans. Circuit and Systems I , vol. 54, no. 3, pp. 544-554, March 2007.
  • Invited Review Paper, J. C. Ranuarez, M. J. Deen, and C.-H. Chen, "A Review of Gate Tunneling Current in MOS Devices," Microelectronics Reliability , vol. 46, Issue 12, pp. 1939-1956, December 2006.
  • Invited Paper, M. J. Deen, C.-H. Chen, S. Asgaran, G. A. Rezvani, J. Tao, and Y. Kiyota, "High Frequency Noise of Modern MOSFETs: Compact Modeling and Measurement Issues," IEEE Trans. Electron Devices , vol. 53, no. 9, pp. 2062-2081, September 2006.
  • J. C. Ranuarez, M. J. Deen, and C.-H. Chen, "Temperature Effects in Complementary Metal-Oxide Semiconductor Microwave Distributed Amplifiers," Journal of Vacuum Science and Technology A , vol. 24(3), pp. 831-834, May/June 2006.
  • S. Asgaran, M. J. Deen, and C.-H. Chen, "A 4 mW Monolithic CMOS LNA at 5.7 GHz with the Gate Resistance Used for Input Matching," IEEE Microwave and Wireless Components Letters vol. 16, no. 4, pp. 188-190, April 2006.
  • Invited Paper, S. Naseh, M. J. Deen, and C.-H. Chen, "Hot-Carrier Reliability of Submicron NMOSFETs and Integrated NMOS Low Noise Amplifiers," Microelectronics Reliability , vol. 46, pp. 201-212, 2006.
  • S. Naseh, M. J. Deen, and C.-H. Chen, "Effects of Hot-Carrier Stress on the Performance of CMOS Low Noise Amplifiers," IEEE Trans. Device and Materials Reliability , vol. 5, no. 3, pp. 501-508, September 2005.
  • J. C. Ranuarez, M. J. Deen, and C.-H. Chen, "Modeling the Partition of Noise from the Gate Tunneling Current in MOSFETs," IEEE Electron Device Letters, vol. 26, no. 8, pp. 550-552, August 2005.
  • Invited Paper, Y. Cheng, M. J. Deen, and C.-H. Chen, "MOSFET Modeling for RFIC Design," IEEE Trans. Electron Devices , vol. 52, no. 7, pp. 1286 - 1303, July 2005.
  • S. Asgaran, M. J. Deen, and C.-H. Chen, "Analytical Modeling of MOSFET's Channel Noise and Noise Parameters," IEEE Trans. Electron Devices , vol. 51, no. 12, pp. 2109 - 2114, December 2004.
  • C.-H. Chen and M. J. Deen, "Channel Noise Modeling of Deep Sub-Micron MOSFETs," IEEE Trans. Electron Device , vol. 49, no. 8, pp. 1484 - 1487, August, 2002.
  • Y. Cheng, C.-H. Chen, M. Matloubian, and M. J. Deen, "High Frequency Small Signal AC and Noise Modeling of MOSFETs for RF IC Design," IEEE Trans. Electron Devices , vol. 49, no. 3, pp. 400 - 408, March 2002.
  • C.-H. Chen, M. J. Deen, Y. Cheng, and M. Matloubian, "Extraction of the Induced Gate Noise, Channel Thermal Noise and their Correlation in Sub-Micron MOSFETs from RF Noise Measurements," IEEE Trans. Electron Devices , vol. 48, no. 12, pp. 2884 - 2892, December 2001.
  • C.-H. Chen and M. J. Deen, "A General Noise and S-Parameter De-Embedding Procedure for On-Wafer High-Frequency Noise Measurements of MOSFETs," IEEE Trans. Microwave Theory and Techniques , vol. 49, no. 5, pp. 1004 - 1005, May 2001.
  • Invited Paper, C.-H. Chen and M. J. Deen, "RF CMOS Noise Characterization and Modeling," International Journal of High Speed Electronics and Systems , vol. 11, no. 4, pp. 1085 - 1157, 2001.
  • C.-H. Chen and M. J. Deen, "Direct Extraction of the Channel Thermal Noise in Metal-Oxide-Semiconductor Field Effect Transistor from Measurements of Their RF Noise Parameters," Journal of Vacuum Science and Technology A (Special Issue for the 9th Canadian Semiconductor Technology Conference), vol. 18(2), pp. 757 - 760, March/April 2000.
  • W. S. Kwan, C.-H. Chen, and M. J. Deen, "Hot-Carrier Effects on RF Noise Characteristics of LDD NMOSFET," Journal of Vacuum Science and Technology A (Special Issue for the 9th Canadian Semiconductor Technology Conference), vol. 18(2), pp. 765 - 769, March/April 2000.
  • E. Abou-Allam, T. Manku, C.-H. Chen, and M. J. Deen, "A Self-Consistent Lumped Radio Frequency Linear Network Model for MOSFETs Taking into Account the Gate Resistance," Canadian Journal of Physics , vol. 77, pp. 371 - 384, 1999.
  • C.-H. Chen and M. J. Deen, "High Frequency Noise of MOSFETs I - Modeling," Solid-State Electronics , vol. 42(11), pp. 2069 - 2081, November 1998.
  • C.-H. Chen, M. J. Deen, Z. X. Yan, M. Schroter, and C. Enz, "High Frequency Noise of MOSFETs II - Experiments," Solid-State Electronics , vol. 42(11), pp. 2083 - 2092, November 1998.
  • C.-H. Chen and M. J. Deen, "Direct Calculation of MOSFET High Frequency Noise Parameters," Journal of Vacuum Science and Technology A (Special Issue for the 8th Canadian Semiconductor Technology Conference), vol. 16(2), pp. 850 - 854, March/April 1998.

    • Refereed Conferences 49

  • N. V. Shahmirzadi, N. K. Nikolova, and C.-H. Chen, "Transmitting Arrays for an Electronically Switched Microwave Breast Scanner," submitted to 2024 IEEE International Symposium on Antennas and Propagation and ITNC-USNC-URSI Radio Science Meeting, Florence, Italy, p. 1 (14–19 Jul. 2024).
  • N. Valizade Shahmirzadi, J. Nguyen, R. Kazemivala, N. K. Nikolova, and C.-H. Chen, "Electronically Scanned Active Sensor Array for the Imaging of Compressed Breast," 17th European Conference on Antennas and Propagation, Florence, Italy, pp. 1–4 (26–31 Mar. 2023).
  • X. Chen, H. Elgabra, C.-H. Chen, J. Baugh, and L. Wei, "Estimation of MOSFET Channel Noise and Noise Performance of CMOS LNAs at Cryogenic Temperatures," 2021 IEEE International Symposium on Circuits and Systems (ISCAS 2021), Daegu, Korea, pp. 1–5, (23–25 May 2021).
  • V. Tyagi, N. K. Nikolova, F. Foroutan, C.-H. Chen, and C. Baard, "UWB Planar Bias-switched Imaging Array for Breast-Cancer Screening," 15th European Conference on Antennas and Propagation (EuCAP 2021), Dusseldorf, Germany, pp. 1–5 (22–26 Mar. 2021).
  • B. Yang, C.-H. Chen, and S. J. Graham, “Signal-to-Noise Measurement of a 4-Channel Parallel Radiofrequency Transmission System for MRI at 3 T,” Proc. Intl. Soc. Magn. Reson. Med., p. 4035 (11 – 14 August 2020).‬
  • B. Yang, F. Tam, B. Davidson, C. Hamani, N. Lipsman, C.-H. Chen, and S. J. Graham, “MRI Safety of Deep Brain Stimulation Devices: Radiofrequency Heating of a Commercial Lead and an Insulated Copper Wire,” Proc. Intl. Soc. Magn. Reson. Med., p. 4182 (11 – 14 August 2020).
  • A. U. Alam, S. Majumder, C.-H. Chen, O. Marinov, and M. J. Deen, “Low Frequency Noise in Electrochemical Sensors for Water Quality Monitoring,” 25th International Conference on Noise and Fluctuations (ICNF 2019), pp. 1-6, Neuchâtel, Switzerland 2019.
  • Invited Paper, C.-H. Chen, X. Chen, and P. Do, "Recent Advancement in High-Frequency Noise Characterization for Nano-Scale FETs," 14 th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT 2018) , pp. 1-4, Qingdao, China (October. 31 - November. 3, 2018).
  • C.-H. Chen, B. Yang, P.-H. Chu, G. Brown, and S. Das, "System Aware DUT Design for Optimum On-Wafer Noise Measurement," 31 st IEEE International Conference on Microelectronic Test Structures (ICMTS '18) , Austin, TX, pp. 206-209 (19-22 March, 2018).
  • X. Chen, C.-H. Chen, and M. J. Deen, "Shot Noise Suppression Factor for Nano-Scale MOSFETs Working in the Saturation Region," 24 th International Conference on Noise and Fluctuations (ICNF 2017), pp. 1-4, Vilnius, Lithuania (20-23 June, 2017).
  • Invited Paper, C.-H. Chen, X. Chen, D. Y. Wu and C. S. Chen, "Future Low-Noise Technologies for RF, Analog and Mixed-Signal Integrated Circuits," The IEEE 11 th International Conference on ASIC ( ASICON 2015), Chengdu, China, pp. 1-4 (3-6 November, 2015).
  • Invited Paper, C.-H. Chen, D. Y. Wu, and M. K. Tsai, "The Impact of Material Property on the Noise Performance of Future Nanoscale Field-Effect-Transistors, " Collaborative Conference on 3D and Materials Research (CC3DMR) 2015 , Busan, South Korea, pp. 277-280 (15-19 June, 2015).
  • X. Chen, N. Misljenovic, B. Hosein, C.-H. Chen, and C. Tsironis, "Calibration of a Noise Receiver Taking Care of its Gain Variations," 23 rd International Conference on Noise and Fluctuations ( ICNF 2015), Xi'an China, pp. 1-4 (2-6 June, 2015).
  • Invited Paper, C.-H. Chen, D. Y. Wu, Y. C. Cheng, and C. S. Chen, "Future CMOS Technology for Low Noise Integrated Circuit Designs," Proc. 2014 12 th International Conference on Solid-State and Integrated-Circuit Technology , Guilin, China, pp. 678-681 (28-31 October, 2014).
  • E. Y. Jeong, M. J. Deen, C.-H. Chen, R.-H. Beak, J.-S. Lee, and Y. H. Jeong, "Physical DC and Thermal Noise Models of 18 nm Double-Gate Junctionless pMOSFETs for Low Noise RF Applications," 46 th International Conference on Solid State Devices and Materials ( SSDM 2014), Tsukuba, Ibaraki, Japan, pp. PS-3-12 (8-11 September, 2014).
  • Invited Paper, C.-H. Chen, D. Chen, R. Lee, P. Lei, and D. Wan, "Thermal Noise Modeling of Nano-Scale MOSFETs for Mixed-signal and RF Applications," IEEE Custom Integrated Circuits Conference ( CICC 2013 ), San Jose, CA, pp. 1-8 (23-25 September, 2013).
  • E. Y. Jeong, Y. H. Jeong, C.-H. Chen, and M. J. Deen, "DC and Thermal Noise Modeling of 20 nm Double-Gate Junctionless MOSFETs," 22 nd International Conference on Noise and Fluctuations ( ICNF 2013), Montpellier, France, pp. 1-4 (24-28 June, 2013).
  • Invited Paper, C.-H. Chen, "Future Integrated Circuit Technology for Low Noise Applications," BIT's 2 nd Annual World Congress of Advanced Materials (WCAM-2013) , Session 6-1, Suzhou, China, p. 6-1.2 (5-7 June, 2013).
  • G. Tan, C.-H. Chen, B. Hung, P. Lei, and C. S. Yeh, "Channel Thermal Noise and its Scaling Impact on Deep Sub-100nm MOSFETs," 21 st International Conference on Noise and Fluctuations ( ICNF 2011), Toronto, Canada, pp. 360-363 (12-16 June, 2011).
  • Invited Paper, C.-H. Chen, B. Hung, S. Huang, J. S. Jan, V. Liang, and C. S. Yeh, "Thermal Noise Performance in Recent CMOS Technologies," The 9 th International Conference on Solid-State and Integrated-Circuit Technology , Beijing, China, pp. 476-479 (20-23 October. 2008).
  • Invited Paper, C.-H. Chen, A. Leung, and H. Gon, "Design and Modeling of RF ICs for Low-Noise and Low-Power Transceivers," International Conference on Electron Devices and Solid-State Circuits , Tainan, Taiwan, pp. 47-52 (20-22 December, 2007).
  • Y. Kiyota, C.-H. Chen, T. Kubodera, A. Nakamura, K. Takeshita, and M. J. Deen, "A New Approach of High Frequency Noise Modeling for 70-nm NMOS by Accurate Noise Source Extraction," 2007 IEEE Radio Frequency Integrated Circuits ( RFIC) Symposium , Honolulu, Hawaii, pp. 635-638 (3-8 June, 2007).
  • Invited Paper, C.-H. Chen, Z. Zeng, J. S. Jan, and C. S. Yeh, "Challenges in HF noise characterization and modeling of Sub-100nm MOSFETs for RF ICs," International Conference on Fluctuations and Noise - Circuits, Devices and Materials , La Pietra Conference Center, Florence, Italy, pp. 66001P1-1P15 (20-24 May, 2007).
  • S. Asgaran, M. J. Deen, and C.-H. Chen, "An Analytical Method to Determine MOSFET's High Frequency Noise Parameters from 50 Ohm Noise Figure Measurements, " IEEE Radio Frequency Integrated Circuits (RFIC) Symposium , San Francisco, CA, pp. 341-344 (11-13 June, 2006).
  • Invited Paper, C.-H. Chen, "High-frequency Noise of MOSFETs - Characterization and Modeling," 13 th International Workshop on the Physics of Semiconductor Devices (IWPSD-2005), New Delhi, India, pp. 787-795 (13-17 December, 2005).
  • Invited Paper, C.-H. Chen, "Issues in High-Frequency Noise Characterization and Modeling of MOSFETs," 1 st IEEE International Workshop on Radio-Frequency Integration Technology (RFIT 2005), Singapore, pp. 119-122 (November 30 - December 2, 2005).
  • Invited Paper, M. J. Deen, J. C. Ranuarez, and C.-H. Chen, "Effect of the Gate Tunneling Current on the High-Frequency Noise of MOSFETs," Workshop on Compact Modeling , Anaheim, CA, vol. 4, pp. 35-39 (8-12 May 2005).
  • S. Asgaran, M. J. Deen, and C.-H. Chen, "Analytical Modeling of MOSFET Noise Parameters for Analog and RF Applications," IEEE Custom Integrated Circuits Conference ( CICC 2004), Orlando, Florida, pp. 379-382 (3-6 October, 2004).
  • Invited Paper, C.-H. Chen, S. Asgaran, F. Li, and M. J. Deen, "Characterization and Modeling of High-Frequency Noise in MOSFETs for RF IC Design," 2 nd International Conference on Fluctuations and Noise - Devices and Circuits , Gran Canaria, Spain, pp. 49-60 (26-28 May, 2004).
  • C.-H. Chen, F. Li, and Y. Cheng, "MOSFET Drain and Induced-gate Noise Modeling and Experimental Verification for RF IC Design," IEEEInternational Conference on Microelectronics Test Structures ( ICMTS 2004), Awaji, Japan, pp. 51-56 (22-25 March, 2004).
  • Invited Paper, M. J. Deen, C.-H. Chen, and Y. Cheng, "MOSFET Modeling for Low Noise, RF Circuit Design," IEEE Custom Integrated Circuits Conference ( CICC 2002), Orlando, Florida, pp. 201 - 208 (12-15 May, 2002) - Best Invited Paper Award.
  • Invited Paper, M. J. Deen, and C.-H. Chen, "RF MOSFET Noise Parameter Extraction and Modeling," 5 th International Conference on Modeling and Simulation of Microsystems ( MSM 2002), San Juan, Puerto Rico, pp. 694 - 697 (22-25 April, 2002).
  • C.-H. Chen, M. Jamal Deen, Y. Cheng, and M. Matloubian, "High-Frequency Noise of MOSFETs," 16th International Conference on Noise in Physical Systems and 1/f Fluctuations ( ICNF 2001), Gainesville, Florida, pp. 181 - 184 (22-25 October, 2001).
  • C.-H. Chen, M. J. Deen, Y. Cheng, and M. Matloubian, "Intrinsic Noise Currents in Deep Submicron MOSFETs," IEEE MTT-S International Microwave Symposium ( IMS 2001), Phoenix, Arizona, pp. 835 - 838 (20-25 May, 2001).
  • C.-H. Chen and M. J. Deen, "A General Procedure for High-Frequency Noise Parameter De-embedding of MOSFETs by Taking the Capacitive Effects of Metal Interconnections into Account," IEEE International Conference on Microelectronic Test Structures ( ICMTS 2001), Kobe, Japan, pp. 109-114 (19-22 March, 2001).
  • C.-H. Chen, M. J. Deen, M. Matloubian, and Y. Cheng, "Extraction of the Induced Gate Noise, Channel Thermal Noise and their Correlation in Sub-Micron MOSFETs from RF Noise Measurements," IEEE International Conference on Microelectronic Test Structures ( ICMTS 2001 ), Kobe, Japan, pp. 131 - 135 (19-22 March, 2001).
  • Invited Paper, M. J. Deen, C.-H. Chen, Y. Cheng, C. Enz, and M. Matloubian, " RF Modeling of MOSFETs," Design, Modeling and Simulation in Microelectronics ( International Symposium on Microelectronics and Assembly - ISMA 2000), Proc. SPIE, vol. 4228, pp. 138 - 152 (28-30 November, 2000).
  • C.-H. Chen, M. J. Deen, M. Matloubian, and Y. Cheng, "Channel Noise Current in Deep Sub-Micron MOSFETs," 30 th European Solid-State Device Research Conference ( ESSDERC' 2000), Cork, Ireland, pp. 508 - 511 (11-13 September, 2000).
  • C.-H. Chen, M. J. Deen, M. Matloubian, and Y. Cheng, "Extraction of the Channel Thermal Noise in MOSFETs," IEEE International Conference on Microelectronic Test Structures ( ICMTS 2000 ), Monterey, California, pp. 42 - 47 (13-16 March, 2000).
  • Invited Paper, Y. Cheng, C.-H. Chen, C. Enz, M. Matloubian, and M. J. Deen, "MOSFET Modeling for RF Circuit Design," 3 rd IEEE International Caracas Conference on Devices, Circuits and Systems ( ICCDCS 2000), Cancun, Mexico, pp. D23, 1 - 8 (15-17 March, 2000).
  • M. J. Deen, C.-H. Chen, M. Matloubian, and Y. Cheng, "Channel Thermal Noise Extraction and Model Verification of MOSFETs," 1999 International Semiconductor Device Research Symposium ( ISDRS '99 ), Charlottesville, Virginia, pp. 85 - 88 (1-3 December, 1999).
  • C.-H. Chen and M. J. Deen, "Direct Extraction of the Channel Thermal Noise in MOSFETs from RF Noise Measurements," 9 th Canadian Semiconductor Technology Conference ( CSTC '99), Ottawa, Canada, p.163 (10-13 August, 1999).
  • W. S. Kwan, C.-H. Chen and M. J. Deen, "Hot-Carrier Effects on RF Noise Characteristics of LDD NMOSFET," 9 th Canadian Semiconductor Technology Conference ( CSTC '99), Ottawa, Canada, p. 79 (10-13 August, 1999).
  • Invited Paper, M. J. Deen and C.-H. Chen, "Some Issues in High Frequency Noise Modeling of MOSFETs," 2 nd International Conference on Unsolved Problems of Noise and Fluctuations ( UPON '99), Adelaide, Australia, pp. 381-392 (11-15 July, 1999).
  • M. J. Deen and C.-H. Chen, "The Impact of Noise Parameter De-embedding on the High Frequency Noise Modeling of MOSFETs," IEEE International Conference on Microelectronic Test Structures ( ICMTS '99 ), Goteborg, Sweden, pp. 34 - 39 (15-18 March, 1999).
  • X. Jin, J-J. Ou, C.-H. Chen, W. Liu, M. J. Deen, P. R. Gray, and C. Hu, "An Effective Gate Resistance Model for CMOS RF and Noise Modeling," International Electron Devices Meeting Technical Digest ( IEDM '98), San Francisco, California, pp. 961 - 964 (6-9 December, 1998).
  • W. S. Kwan, C.-H. Chen, and M. J. Deen, "Hot-Carrier Effects on the High Frequency Performance of 0.8mm LDD NMOSFETs," 1997 International Semiconductor Device Research Symposium ( ISDRS '97 ), Charlottesville, Virginia, pp. 195 - 198 (11-13 December, 1997).
  • C.-H. Chen and M. J. Deen, "Direct Calculation of the MOSFET High Frequency Noise Parameters," 14 th International Conference on Noise in Physical Systems and 1/f Fluctuations , Leuven, Belgium, Eds. C. Claeys and E. Simoen, World Scientific Publishing, Singapore, pp. 436 - 439 (14-18 July, 1997).
  • C.-H. Chen and M. J. Deen, "Direct Calculation of the MOSFET High Frequency Noise Parameters," 8 th Canadian Semiconductor Technology Conference ( CSTC'97), Ottawa, Canada, p. 147 (12-15 August, 1997).

    • Refereed Book Chapter 2

  • Invited Book Chapter, C.-H. Chen, Thermal Noise in Modern CMOS Technology, Solid State Circuits Technologies , Edited by: Jacobus W. Swart, ISBN 978-953-307-045-2, In-Tech, Austria, pp. 83-100, January 2010.
  • Invited Book Chapter, C.-H. Chen and M. J. Deen, RF CMOS Noise Characterization and Modeling, in Selected Topics in Electronics and Systems - Vol. 24: CMOS RF Modeling, Characterization and Applications , Eds. M. Jamal Deen and Tor A. Fjeldy, World Scientific Publishing, Singapore, pp. 199-271 (2002).

    • Workshop Papers 9

  • C.-H. Chen, S. Naseh, and M. J. Deen, "Design Strategies of a Low Noise Amplifier and Some Reliability Considerations," 2002 Micronet R & D Annual Workshop , Aylmer, Quebec, Canada, pp. 85-86 (25-26 April, 2002).
  • C.-H. Chen and M. J. Deen, "A General Procedure for High-Frequency Noise Parameter De-embedding of MOSFETs by Taking the Capacitive Effects of Metal Interconnections into Account," 2001 Micronet R & D Annual Workshop , Aylmer, Quebec, Canada, pp. 103 - 104 (19-20 April, 2001).
  • C.-H. Chen and M. J. Deen, "Extraction of the Induced Gate Noise, Channel Noise and their Correlation in Sub-Micron MOSFETs from RF Noise Measurements, " 2001 Micronet R & D Annual Workshop , Aylmer, Quebec, Canada, pp. 101 - 102 (19-20 April, 2001).
  • C.-H. Chen and M. J. Deen, "Channel Thermal Noise Extraction and Model Verification of MOSFETs," Micronet 10th Anniversary Workshop , Ottawa, Ontario, Canada, pp. 87 - 88 (27-28 April, 2000).
  • C.-H. Chen, W. S. Kwan, and M. J. Deen, "Experimental Results on High Frequency Noise Parameter De-Embedding of MOSFETs," 1999 Micronet Annual Workshop , Ottawa, Ontario, Canada, pp. 66 - 67 (26-27 April, 1999).
  • C.-H. Chen, W. S. Kwan, and M. J. Deen, "Theory of High Frequency Noise Parameter De-Embedding of MOSFETs," 1999 Micronet Annual Workshop , Ottawa, Ontario, Canada, pp. 64 - 65 (26-27 April, 1999).
  • C.-H. Chen, M. J. Deen, Z. X. Yan, and M. Schroter, "High Frequency Noise of MOSFETs - Experiments and Modeling," 1998 Micronet Annual Workshop , Ottawa, Ontario, Canada, pp. 15 - 16 (5-6 April, 1998).
  • C.-H. Chen, W. S. Kwan, L. Nathawad, and M. J. Deen, "Direct Calculation of the MOSFET High Frequency Noise Parameters," 1997 Micronet Annual Workshop , Ottawa, Ontario, Canada, pp. 17 - 18 (2-3 March, 1997).
  • C.-H. Chen and M. J. Deen, "Analytical Modelling of the High Frequency Noise in MOSFETs," 1996 Micronet Annual Workshop , Ottawa, Ontario, Canada, pp. 15 - 16 (3-4 March, 1996).
Last updated on February 06, 2024